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Wafer thickness instrument

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Wafer thickness instrument

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Wafer thickness measuring instrument

This device measures the thickness of wafers and display panels after partial processes such as wafer slicing, grinding, thinning, and slicing. Can synchronously test the TTVBOWWRAP/SORI and other parameter errors of the material itself.

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semiconductor

wafer

thickness

measure

Wafer thickness measuring instrument

Wafer thickness instrument

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